Showing results: 226 - 240 of 628 items found.
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Qmax Test Technologies Pvt. Ltd.
Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.
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Test Head Engineering, LLC
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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CTS -
Teradyne, Inc.
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Spectrum-9100™ -
Teradyne, Inc.
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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EXC-664PCIe -
Excalibur Systems, Inc.
The EXC-664PCIe board is an ARINC-664 part 7 test and simulation board designed to help integrate avionics suites, and can simulate up to two ARINC-664 P7 End Systems with full dual redundant support for receive and transmit operation. The board also contains room for two standard 4000 modules that can support multiple channels of other avionics communications protocols including MIL-STD-1553, ARINC-429, Serial, Discrete, ARINC-708 and CANbus.
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ScanExpress JET -
Corelis, Inc.
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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ScanExpress Viewer -
Corelis, Inc.
ScanExpress Viewer™ is a printed circuit board (PCB) CAD data & photograph visualization tool for boundary-scan test development, electronic manufacturing test, and product repair environments.When combined with ScanExpress ADO™ (Advanced Diagnostics Option) for detailed results from ScanExpress Runner™, ScanExpress Viewer displays fault coordinates and connected traces superimposed directly on a board photograph or CAD layout diagram for expedient repair.
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Nidec-Read Corporation
NIDEC-READ offers an array of testing equipment used to conduct open/leak tests on motherboards, as well as many other printed circuit boards. They can be flexibly configured according to applications in terms of size, type, and the number of test pins required.
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MS 1106 -
Meltronics Systemtech
PSS PCB Tester is a powerful system used to test and validate DAWN (RWR & JAMMER) Support System boards. It has RS232/USB Communication for PC Interface.
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PCB -
S.E.A. Datentechnik GmbH
The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Best Electronics and Components Co., Inc.
USEA is involved at all levels of test development, including the necessary test board design and layout, software development, socket design and build, etc. We work on programs at all stages of the product development timeline and through to manufacturing.
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V250 / V250PXI -
Qmax Test Technologies Pvt. Ltd.
V250 / V250PXI is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.
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SKU-014-01 -
Amfeltec Corp.
The 32-bit PCI Test Backplane was designed to support production testing/debugging of PCI-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into four 32-bit PCI slots via 7 ft CAT6 cable. The PCI backplane is a versatile platform that allows you to test up to 4 PCI boards at the same time, facilitates easy access to logic signals, provides hot-swap compatibility, and per-slot overcurrent protection.
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ELMA Electronic, Inc.
Embedded Computing Systems require more than just a chassis housing with backplane, power supply, cooling and payload boards. To compliment our wide range of systems, Elma offers a comprehensive range of system level accessories, including: I/O solutions, HMI displays, system/power management controllers and test & development boards.
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ScanExpress JTAG Debugger -
Corelis, Inc.
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
